Nikon's N-SIM S Microscope

Nikon's N-SIM S Microscope

SIM (Structured Illumination Microscopy) is a form of super resolution microscopy that allows living and fixed fluorescent samples to be observed at approximately twice the resolution of a standard fluorescence microscope. Imaging at this higher resolution can reveal structural sub-cellular organisation which would otherwise be masked on a standard microscope.

Microscope Details

  • Sample size: single cells, organoids
  • Main application: Structured Illumination Microscopy (SIM)
  • Modalities: 2D and 3D SIM, TIRF SIM
  • Spatial resolution: ~115 nm lateral, ~270 nm axial
  • Temporal resolution: medium (~15 fps)
  • Environmental control: Temperature, humidity and CO2
  • Excitation Lasers: 405, 488, 560, 640 nm