Microscopes and ancillary equipment Details of microscopes and ancillary equipment at the Centre for Electron Microscopy. Microscope Worktribe facility number Electron source Analytics-EDS Analytics-EBSD Analytics-WDS SEM-Hitachi TM3030 Desktop 539 Tungsten Filament Oxford Instruments-SwiftID SEM-Jeol JSM-6060 540 Tungsten Filament Oxford Instruments-Inca Xact SEM-Zeiss EVO10 Materials 541 LaB6 tip SEM-Zeiss EVO15 VP ESEM 542 LaB6 tip Bruker-Quantax Esprit-X Flash 6I60 Bruker-Quantax Esprit-E Flash FS SEM-Jeol JSM-7000F 543 Field emission gun (FEG) Oxford Instruments-Aztec-UltimMax Oxford Instruments-Aztec Nordlys Oxford Instruments-Inca Wave SEM-FEI FIB Quanta 3D 544 Field emission gun (FEG) Oxford Instruments-Inca Xact Oxford Instruments-HKL Nordlys SEM-TF Apreo 2S HiVac 545 Field emission gun (FEG) Thermo Fisher Scientific-ColorSEM UltraDry TEM-Jeol JEM-1400 546 Tungsten Filament TEM-Jeol JEM-2100 547 LaB6 tip TEM-Philips Tecnai F20 548 Field emission gun (FEG) Oxford Instruments-Aztec Xmax SEM-TF Helios 5 Hydra UX TriBeam 626 Field emission gun (FEG) MicroCT-Nikon X-TEK XT H225 627 Tungsten Filament Deben-2kN stage MT2000 (on Apreo) 628 N/A Quorum PP3010 Cryo-FIB/SEM Preparation System TBC N/A